Official UK procurement notice
Plasma Focused Ion Beam and Gallium Focused Ion Beam Microscopes
Authority: University of Bristol (Education)
What is being bought
Published requirement descriptionThis notice has been issued as a revision of notice 2022/S 000-035764 published on 16th December 2022. This notice contained incorrect weightings on the technical and cost criteria.
The IAC at UoB has identified a need to procure a Plasma-Focused Ion Beam (PFIB) system, which allows for:
- Dual-beam capability with field emission gun scanning electron microscopy (FEGSEM) and plasma-based focused ion beam,
- Micromachining with high milling rates,
- Sample liftout (size reduction),
- Tomography with analytical capability – integrating energy-dispersive X-ray (EDX) and electron backscatter diffraction (EBSD) bought separately from a third party supplier,
- Gas injection using XeF2 enhanced etch, insulator, platinum and carbon, with options of other gas species.
- Cryogenic stage and vacuum transfer capability,
- Preparation of specimens for transmission electron microscopy (TEM) while minimising FIB-induced damage, atom probe tomography (APT) and micromechanical testing.
- Electrical feedthroughs for in-situ characterisation (minimum four channels for four-point resistance measurements).
In addition to the procurement of the PFIB instrument, UoB would like to also as part of this call upgrade the gallium focused ion beam (Ga-FIB) capability of the IAC facility, by procurement of a new Ga-FIB instrument, with the capability for:
- Dual-beam capability with FEGSEM and gallium focused ion beam
- Micromachining and imaging,
- Microcantilever manipulation of specimens for TEM, APT and micromechanical liftouts,
- Gas injection using XeF2 enhanced etch, insulator and organo-metallics containing platinum, with options of other gas species.
Both of these instruments will be utilized within the Interface Analysis Centre (IAC) microscopy and materials facility at UoB, which will be used by a large number of researchers from a large number of UK, European and worldwide Universities, Research Institutes and Industry, thus the equipment and associated software must be simple and straightforward to use, robust and also be sufficiently interlocked to protect the system against accidental misuse.
CPV: Ion microscopes
The lotProcurement structure
single lot · no lot value publishedLot #1The IAC at UoB has identified a need to procure a Plasma-Focused Ion Beam (PFIB)…Awarded
The IAC at UoB has identified a need to procure a Plasma-Focused Ion Beam (PFIB) system, which allows for:
- Dual-beam capability with field emission gun scanning electron microscopy (FEGSEM) and plasma-based focused ion beam,
- Micromachining with high milling rates,
- Sample liftout (size reduction),
- Tomography with analytical capability – integrating energy-dispersive X-ray (EDX) and electron backscatter diffraction (EBSD) bought separately from a third party supplier,
- Gas injection using XeF2 enhanced etch, insulator, platinum and carbon, with options of other gas species.
- Cryogenic stage and vacuum transfer capability,
- Preparation of specimens for transmission electron microscopy (TEM) while minimising FIB-induced damage, atom probe tomography (APT) and micromechanical testing.
- Electrical feedthroughs for in-situ characterisation (minimum four channels for four-point resistance measurements).
In addition to the procurement of the PFIB instrument, UoB would like to also as part of this call upgrade the gallium focused ion beam (Ga-FIB) capability of the IAC facility, by procurement of a new Ga-FIB instrument, with the capability for:
- Dual-beam capability with FEGSEM and gallium focused ion beam
- Micromachining and imaging,
- Microcantilever manipulation of specimens for TEM, APT and micromechanical liftouts,
- Gas injection using XeF2 enhanced etch, insulator and organo-metallics containing platinum, with options of other gas species.
Both of these instruments will be utilized within the Interface Analysis Centre (IAC) microscopy and materials facility at UoB, which will be used by a large number of researchers from a large number of UK, European and worldwide Universities, Research Institutes and Industry, thus the equipment and associated software must be simple and straightforward to use, robust and also be sufficiently interlocked to protect the system against accidental misuse.
What it takes to wini
How this buyer will score bids.
The evaluation criteria and weights exactly as published on the notice, grouped by family (price, quality, social value and so on).
Evaluation split and conditions of participation as published; the tender pack may add morei
How this buyer will score bids.
The evaluation criteria and weights exactly as published on the notice, grouped by family (price, quality, social value and so on).
Published sub-criteria (2)
- Technical: 80%
- Price: 20%
Published award criteria (2)
- Technical: 80
- Price: 20
- Price carries 20 of 100 points: a 10% discount moves about 2 points. The method statement decides this lot, not the discount.
Price arithmetic assumes straight proportional scoring; the tender pack may use another formula.
Procedure terms & legal framework
From the official record- Procedure method
- Open procedure
- Legal basis
- CELEX · 32014L0024 Public Contracts Regulations 2015 (Directive 2014/24/EU)
- Procurement category
- Goods
- Notice status
- Awarded
- Procurement threshold
- Unspecified in notice
- Regulatory regime
- Standard
- Commercial structure
- Stand-alone contract (no framework)
- Competition type
- Competitive procedure
- GPA / WTO covered
- Yes (GPA)
- Recurring procurement
- No (one-off requirement)
- First published
- 23 Sept 2022, 10:50 BST
- Last source update
- 22 Dec 2022, 13:03 GMT
- Award evaluation window
- 24 Oct 2022 – …
- FTS notice number
2022/S 000-036382- Classification (CPV)
- Delivery area
- Official registry OCID
ocds-h6vhtk-036addFind a Tender
How it was run
Official notice- Submission deadline
- 24 Oct 2022, 12:00 BST
- Submission channel
- {"electronicSubmission","written"}
- Accepted languages
- en
- Bids opened
- 24 Oct 2022, 12:00 BST
Timeline
24 Oct 2022 → 22 Dec 2022 · 4 dates- Submission deadline24 Oct 2022, 12:00 BST
- Bids opened24 Oct 2022, 12:00 BST
- Contract starts28 Nov 2022
- Notice published22 Dec 2022, 13:03 GMT
Notice history
1 event · 3 releases on Find a Tender- Status changed to complete16 Dec 2022, 18:32 GMT
Commercial outcome & contract awards
Published awards, contracts and bid statistics, not a forecast| Awarded to | Value | Date | Status |
|---|---|---|---|
| FEI UK Limited | £1,790,000 †same award published again · counted once | — | Awarded |
| FEI UK Limited | £1,790,000 † | — | Awarded |
Contracts
Plasma Focused Ion Beam and Gallium Focused Ion Beam Microscopes · FEI UK Limited
- Signed
- 22 Nov 2022
- Value
- £1,790,000
- Period
- … – 27 Nov 2024
- Status
- active
Plasma Focused Ion Beam and Gallium Focused Ion Beam Microscopes · FEI UK Limited
- Signed
- 22 Nov 2022
- Value
- £1,790,000
- Period
- … – 27 Nov 2024
- Status
- active
Bid statistics published by the authority
| Bids | SME | VCSE | Valid bid range |
|---|---|---|---|
| 2bids | — | — | — |
Contracting authority & participating public bodies
Dispute resolution & review bodies
- The University of BristolReview body
Bidders & participating suppliers
1 commercial party on the notice- FEI UK LtdAwarded supplier
Official documents & specifications
Official links; attachments are not copiedNo document links were published on the notice.